OU EMPL Instrumental Hardware Configuration

Instrument Type: CAMECA SX100

Electron Optical Column Specifications

Accelerating Voltages: ú 50 KV

Beam Currents: automatic regulation in the range 1-1000 nA; manual control to lower currents

 

Analytical Configuration

1. X-ray take-off geometry: 40░

2. Wavelength dispersive spectrometers: five, asynchronous, configured as

Spec.#

Type*

Diffraction Devices

1

LP

TAP, PET, PC0(2d=45┼) , PC1(2d=62.5┼)

2

LP

TAP, PET

3

HP

LiF, PET

4

HP

LPET, LLiF

5

LP

TAP, PET, PC3 (2d=200┼), PC2 (2d=95┼)

* HP: High-pressure (26-33 psi) P10 gas, 6 mm mylar window at column and detector

* LP: Low-pressure (2-4 psi) P10 gas, thin polypropylene windows at column and detector

 

3. Energy Dispersive X-Ray Detector: Thermo Ultra-Dry Silicon Drift Detector running under NORAN System Seven automation.

 

Imaging Hardware

Secondary Electron Detector: Cameca Standard

Backscattered Electron Detector: Cameca TV rate, variable-gain (fast) BSE

Cathodoluminescence Detector: GATAN PanaCL/F with removable RGB wavelength-band filters

 

Automation

Our SX100 is equipped with both CAMECA PEAKSIGHT software and John Donovanĺs full Probe for EPMA system.

 

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